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http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1921| CHARACTERIZATION OF A SUB-MM WAVE FREQUENCY SELECTIVE SURFACE ON A PERIODICALLY PERFORATED SILICON SUBSTRATE | |
| ANGEL ENRIQUE SANCHEZ COLIN | |
| Acceso Abierto | |
| Atribución-NoComercial-SinDerivadas | |
| Optical transmission Frequency selective surface | |
| We carried out measurements of optical transmission through a Frequency Selective Surface (FSS) on a silicon substrate perforated periodically with square cavities of 1 mm². The substrate is covered on one side with a thin film (1 μm thick) of silicon-nitride, thus forming a membrane for each cavity. The measurements were taken using a Martin-Puplett Interferometer over a spectral range from 100 to 650 GHz, providing a maximum transmission value of around 40% at 480 GHz. Analytical and computed results are also presented for comparison purposes. | |
| Progress In Electromagnetics Research M. | |
| 2012 | |
| Artículo | |
| Inglés | |
| Estudiantes Investigadores Público en general | |
| Colin, Angel., et al., (2012), Characterization of a sub-mm wave frequency selective surface on a periodically perforated silicon substrate, Progress In Electromagnetics Research M, Vol. 27: 75-81. | |
| ASTRONOMÍA Y ASTROFÍSICA | |
| Versión aceptada | |
| acceptedVersion - Versión aceptada | |
| Aparece en las colecciones: | Artículos de Astrofísica |
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| 10 Colin_2012_ProgElecRese27.pdf | 263.37 kB | Adobe PDF | Visualizar/Abrir |