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Fabrication and characterization of un-cooled micro-bolometers based on silicon germanium thin films obtained by low frequency plasma deposition
MARIO MORENO MORENO
ANDREY KOSAREV
ALFONSO TORRES JACOME
Acceso Abierto
Atribución-NoComercial-SinDerivadas
Germanium
Plasma enhanced chemical vapor deposition
IR detectors
We report the study of a fabrication process and characterization of un-cooled micro-bolometers based on silicon germanium thin films deposited by low frequency PE CVD technique at low temperature and fully compatible with the IC fabrication technology. Surface micromachining techniques were used for the micro-bolometer fabrication onto a silicon wafer. The a-SixGe1-x:H thermo-sensing film used in those devices have shown high activation energy providing high thermal coefficient of resistance and improved but still high resistance. We studied the effect on the electrical properties of the device when boron is incorporated in the a-SixGe1-x:H film. The temperature dependence of conductivity ¾(T), current-voltage characteristics I(U) and noise spectral density have been measured in order to characterize and compare the performance of micro-bolometers with both types of films: a-SixGe1-x:H and a-GexBySiz:H.
REVISTA MEXICANA DE FÍSICA
2007-12
Artículo
Inglés
Estudiantes
Investigadores
Público en general
M. Moreno
A. Kosarev
A. Torres
ELECTRÓNICA
Versión aceptada
acceptedVersion - Versión aceptada
Aparece en las colecciones: Artículos de Electrónica

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